Huhtinen H., Paturi P., Driessche I.V., Palonen H., Rijckaert H., Khan M.Z., Aye M.M., Rivasto E., Salojarvi E., Haalisto C., Makila E.
Ключевые слова: HTS, EuBCO, coated conductors, fabrication, growth rate, high rate process, PLD process, IBAD process, substrate Hastelloy, doping effect, defects columnar, nanoscaled effects, X-ray diffraction, microstructure, critical caracteristics, Jc/B curves, critical current density, angular dependence, experimental results
Huhtinen H., Golmar F., Acha C., Sanca G.A., Barella M., Alurralde M., Marlasca F.G., Paturie P., Levy P.
Ключевые слова: HTS, EuBCO, doping, PLD process, IBAD process, coated conductors, films epitaxial, fabrication, X-ray diffraction, microstructure, critical caracteristics, Jc/B curves, anisotropy, pinning
Ключевые слова: PLD process, commercialization, coated conductors, fabrication, pinning centers, nanoscaled effects
Ключевые слова: thin films, PLD process, substrate SrTiO3, GdBCO, coated conductors, IBAD process, ion irradiation, irradiation effects, defects columnar, microstructure, critical caracteristics, critical current, angular dependence, anisotropy, critical current density, n-value, magnetic field dependence, X-ray diffraction, experimental results, HTS, YBCO
Ключевые слова: chalcogenide, FeSeTe, coated conductors, PLD process, IBAD process, RABITS process, substrate Hastelloy, template layers, thin films, substrate single crystal, comparison, X-ray diffraction, lattice parameter, resistive transition, magnetization, temperature dependence, critical caracteristics, Jc/B curves, microstructure, fabrication, experimental results
Chen I., Wu M., Wang C., Wang M., Moon S., Yang C., MacManus-Driscoll J., Gantepogu C.S., Ganesan P.
Ключевые слова: HTS, GdBCO, coated conductors, fabrication, PLD process, multilayered structures, nanoscaled effects, IBAD process, substrate Ni-W, X-ray diffraction, microstructure, resistive transition, susceptibility, temperature dependence, magnetic field dependence, upper critical fields, critical caracteristics, Jc/B curves, pinning force, angular dependence, experimental results
Ключевые слова: chalcogenide, thin films, coated conductors, fabrication, substrate metallic, PLD process, review, IBAD process, buffer layers, critical caracteristics, Jc/B curves, critical current density, angular dependence, anisotropy, X-ray diffraction, resistivity, temperature dependence, magnetic field dependence, upper critical fields, irreversibility fields, pinning force, microstructure, experimental results
Ключевые слова: LTS, thin films, PLD process, X-ray diffraction
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.